An Empirical Evaluation of Machine Learning Techniques for Crop Prediction

被引:3
|
作者
Mariammal, G. [1 ]
Suruliandi, A. [2 ]
Raja, S. P. [3 ]
Poongothai, E. [4 ]
机构
[1] Vel Tech Rangarajan Dr Sagunthala R&D Inst Sci & T, Dept Comp Sci & Engn, Chennai 600062, Tamil Nadu, India
[2] Manonmaniam Sundaranar Univ, Dept Comp Sci & Engn, Tirunelveli 627012, Tamil Nadu, India
[3] Vellore Inst Technol, Sch Comp Sci & Engn, Vellore, Tamil Nadu, India
[4] SRM Inst Sci & Technol, Dept Comp Sci & Engn, Chennai, Tamil Nadu, India
关键词
Classification; Crop Prediction; Environmental Characteristics; Machine Learning; Soil Characteristics;
D O I
10.9781/ijimai.2022.12.004
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
Agriculture is the primary source driving the economic growth of every country worldwide. Crop prediction, which is critical to agriculture, depends on the soil and environment. Nutrient levels differ from area to area and greatly influence in crop cultivation. Earlier, the tasks of crop forecast and cultivation were undertaken by farmers themselves. Today, however, crop prediction is determined by climatic variations. This is where machine learning algorithms step in to identify the most relevant crop for cultivation. This research undertakes an empirical analysis using the bagging, random forest, support vector machine, decision tree, Naive Bayes and k-nearest neighbor classifiers to predict the most appropriate cultivable crop for certain areas, based on environment and soil traits. Further, the suitability of the classifiers is examined using a GitHub prisoners' dataset. The experimental results of all the classification techniques were assessed to show that the ensemble outclassed the rest with respect to every performance metric.
引用
收藏
页码:96 / 104
页数:217
相关论文
共 50 条
  • [1] Crop Yield Prediction using Machine Learning Techniques
    Medar, Ramesh
    Rajpurohit, Vijay S.
    Shweta
    2019 IEEE 5TH INTERNATIONAL CONFERENCE FOR CONVERGENCE IN TECHNOLOGY (I2CT), 2019,
  • [2] Crop yield prediction using machine learning techniques
    Iniyan, S.
    Varma, V. Akhil
    Naidu, Ch Teja
    ADVANCES IN ENGINEERING SOFTWARE, 2023, 175
  • [3] Software Defect Prediction for Healthcare Big Data: An Empirical Evaluation of Machine Learning Techniques
    Khan, Bilal
    Naseem, Rashid
    Shah, Muhammad Arif
    Wakil, Karzan
    Khan, Atif
    Uddin, M. Irfan
    Mahmoud, Marwan
    JOURNAL OF HEALTHCARE ENGINEERING, 2021, 2021 (2021)
  • [4] Crop Yield Prediction Using Ensemble Machine Learning Techniques
    P. Kuppan
    V. Vishwa Priya
    SN Computer Science, 5 (8)
  • [5] A Comprehensive Review on Crop Disease Prediction Based on Machine Learning and Deep Learning Techniques
    Patil, Manoj A.
    Manohar, M.
    THIRD CONGRESS ON INTELLIGENT SYSTEMS, CIS 2022, VOL 1, 2023, 608 : 481 - 503
  • [6] Empirical analysis of machine learning techniques for prediction of indian exchange rate
    Pandey, Trilok Nath
    Tripathy, Nrusingha
    Hota, Sarbeswar
    Patra, Bichitrananda
    JOURNAL OF STATISTICS AND MANAGEMENT SYSTEMS, 2023, 26 (01) : 13 - 22
  • [7] Empirical Analysis for Investigating the Effect of Machine Learning Techniques on Malware Prediction
    Vijayvargiya, Sanidhya
    Kumar, Lov
    Murthy, Lalita Bhanu
    Misra, Sanjay
    Krishna, Aneesh
    Padmanabhuni, Srinivas
    PROCEEDINGS OF THE 18TH INTERNATIONAL CONFERENCE ON EVALUATION OF NOVEL APPROACHES TO SOFTWARE ENGINEERING, ENASE 2023, 2023, : 453 - 460
  • [8] Empirical assessment of machine learning based software defect prediction techniques
    Challagulla, VUB
    Bastani, FB
    Yen, IL
    Paul, RA
    WORDS 2005: 10TH IEEE INTERNATIONAL WORKSHOP ON OBJECT-ORIENTED REAL-TIME DEPENDABLE, PROCEEDINGS, 2005, : 263 - 270
  • [9] Empirical assessment of machine learning based software defect prediction techniques
    Challagulla, Venkata Udaya B.
    Bastani, Farokh B.
    Yen, I-Ling
    Paul, Raymond A.
    INTERNATIONAL JOURNAL ON ARTIFICIAL INTELLIGENCE TOOLS, 2008, 17 (02) : 389 - 400
  • [10] Empirical Assessment of Machine Learning Techniques for Software Requirements Risk Prediction
    Naseem, Rashid
    Shaukat, Zain
    Irfan, Muhammad
    Shah, Muhammad Arif
    Ahmad, Arshad
    Muhammad, Fazal
    Glowacz, Adam
    Dunai, Larisa
    Antonino-Daviu, Jose
    Sulaiman, Adel
    ELECTRONICS, 2021, 10 (02) : 1 - 19