Radiation Effects of Advanced Electronic Devices and Circuits

被引：0
|
作者：
Chi, Yaqing [1 ,2 ]
Cai, Chang [3 ]
Cai, Li [4 ]
机构：
[1] Natl Univ Def Technol, Coll Comp, Changsha 410073, Peoples R China
[2] Natl Univ Def Technol, Key Lab Adv Microprocessor Chips & Syst, Changsha 410073, Peoples R China
[3] Fudan Univ, State Key Lab ASIC & Syst, Shanghai 201203, Peoples R China
[4] Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China
来源：
ELECTRONICS | 2024年 / 13卷 / 06期
基金：
中国国家自然科学基金;
关键词：
TECHNOLOGY; SIMULATION;
D O I：
10.3390/electronics13061073
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页数：6
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