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Leaf Spot Caused by Alternaria tenuissima on Rhamnella franguloides in China
被引:0
|作者:
Pan, Xiangming
[1
]
Zhou, Yixuan
[1
]
Liu, Dongxue
[1
]
Wang, Yiyi
[1
]
Sheng, Yuting
[1
]
Zhang, Hongxia
[1
,2
]
机构:
[1] Ludong Univ, Engn Res Inst Agr & Forestry, Yantai 264025, Shandong, Peoples R China
[2] Shandong Acad Agr Sci, Shandong Inst Sericulture, Yantai 265503, Shandong, Peoples R China
关键词:
Alternaria tenuissima;
pathogen detection;
Rhamnella franguloides;
D O I:
10.1094/PDIS-11-23-2342-PDN
中图分类号:
Q94 [植物学];
学科分类号:
071001 ;
摘要:
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页数:1
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