Sophisticated Double-Slit Interference Experiments Using Electron Waves

被引:0
|
作者
Harada, Ken [1 ]
Takahashi, Yoshio [2 ]
机构
[1] CEMS, RIKEN, Hatoyama, Saitama 3500395, Japan
[2] Hitachi Ltd, R&D Grp, Hatoyama, Saitama 3500395, Japan
关键词
Double slit; Electron wave; Wave; particle duality; Interference; Electron microscope;
D O I
10.1380/ejssnt.2023-039122
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Electron double-slit experiments, the essence of quantum me-chanical "wave/particle duality", have been extensively and con-tinuously studied because their unrealistic interpretations have attracted many researchers. Here, we discuss recent sophisticated V-shaped double-slit experiments to elucidate electron-path in-formation, i.e., which slit electrons pass through, which path they pursue, and where they arrive and interfere on the image plane. In a transmission electron microscope, an optically zero -propaga-tion distance condition was realized, where the double-slit posi-tion was imaged just on the detector plane. Interference fringes composed of dot images were controlled by using two electron biprisms. Using a V-shaped double slit, we confirmed that it is possible to observe interference fringes only when the path information of individual electrons is not available. Furthermore, we studied how the interference fringes would shift their detected positions when electron wave phases were modulated before il-lumination to the double slit. Phase shifts were generated by tilting electron beams. We confirmed that each single electron as a wave changed its phase even when it traveled alone inside the microscope.
引用
收藏
页码:121 / 127
页数:7
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