Model-Based ISO 14971 Risk Management of EEG-Based Medical Devices

被引:0
|
作者
Yakymets, N. [1 ,2 ]
Zanetti, R. [1 ]
Ionescu, A. [2 ]
Atienza, D. [1 ]
机构
[1] Ecole Polytech Fed Lausanne, ESL, CH-1015 Lausanne, Switzerland
[2] Ecole Polytech Fed Lausanne, Nanoelect Devices Grp NANOLAB, CH-1015 Lausanne, Switzerland
基金
欧盟地平线“2020”;
关键词
D O I
10.1109/EMBC40787.2023.10340131
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
Risk management (RM) is a key component of the development of modern medical devices (MD) to achieve acceptable functional safety and pass the regulatory process. The emerging availability of various techniques, languages, and tools that use model-based system engineering (MBSE) promises to facilitate the development and analysis of complex MD. In this paper, we show how to integrate RM principles and activities recommended in ISO 14971 medical standard into an MBSE-driven MD development process. We propose a method and framework capable of modeling essential RM concepts and performing RM and safety analysis in the early stages of the MD development life cycle. The framework extends OMG RAAML (Object Management Group Risk Analysis and Assessment Modeling Language) to the medical domain according to ISO 14971. We illustrate our approach using a case study of the e-Glass system developed for real-time EEG-based subject monitoring with the intended use of stress monitoring.
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页数:7
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