Atomic force microscopy bending tests of a suspended rod-shaped object: Accounting for object fixing conditions

被引：2

作者：

Ankudinov, Alexander ^{[1
]}

Dunaevskiy, Mikhail ^{[1
]}

Khalisov, Maksim ^{[1
,2
]}

Khrapova, Ekaterina ^{[1
]}

Krasilin, Andrei ^{[1
]}

机构：

[1] Ioffe Inst, St Petersburg 194021, Russia

[2] Russian Acad Sci, Pavlov Inst Physiol, St Petersburg 199034, Russia

来源：

PHYSICAL REVIEW E | 2023年 / 107卷 / 02期

关键词：

ELASTIC-MODULUS; CATALYSTS; NANOSCROLLS; COMPOSITES; AFM;

D O I：

10.1103/PhysRevE.107.025005

中图分类号：

O35 [流体力学]; O53 [等离子体物理学];

学科分类号：

070204 ; 080103 ; 080704 ;

摘要：

The technique of atomic force microscopy (AFM) bending tests of a suspended nano-object (scroll, tube, rod) makes it possible to calculate the Young's modulus of the material it is made of based on experimental data. However, the calculation results involve a large error due to uncertain conditions (console or bridge) of fixing the test object. One of the ways to reduce this error is based on the theoretical consideration of consoles or bridges as beams with one or two ends resting on Winkler elastic foundations. The beam bending problems have been solved in both cases using Krylov's functions. This has allowed for developing an approach to the analytical identification of fixing conditions and including them in the calculations. The application of the approach is illustrated by AFM measurements of the Young's modulus of MgNi2Si2O5(OH)4 nanoscrolls.

引用

页数：8

共 8 条

[1] Determining Young's and shear moduli of a rod-shaped object in an AFM bending test
Ankudinov, Alexander, V
Dunaevskiy, Mikhail S.
Krasilin, Andrei A.
Khalisov, Maksim M.
Khrapova, Ekaterina K.
NANOSYSTEMS-PHYSICS CHEMISTRY MATHEMATICS, 2024, 15 (01): : 122 - 129
[2] Langevin simulations of rod-shaped object alignment by surface flow
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[3] Imaging the Ultrastructure of Isolated Peptidoglycan Sacculi from Rod-Shaped Helicobacter pylori J99 Cells by Atomic Force Microscopy
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Sendker, Jandirk
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MOLECULES, 2025, 30 (01):
[4] Design of Vision Assistant System for an Atomic Force Microscopy Based on Object Detection
Ren, Yifei
Fan, Zhi
Wu, Yinan
Liu, Cunhuan
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2019 IEEE INTERNATIONAL CONFERENCE ON MANIPULATION, MANUFACTURING AND MEASUREMENT ON THE NANOSCALE (IEEE 3M-NANO), 2019, : 270 - 275
[5] Nanoscale bending movement of biological micro-object induced by femtosecond laser impulse and its detection by atomic force microscopy
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Iino, Takanori
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APPLIED PHYSICS EXPRESS, 2014, 7 (08)
[6] Atomic Force Microscopy (AFM) Analysis of an Object Larger and Sharper than the AFM Tip
Chen, Zhe
Luo, Jiawei
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MICROSCOPY AND MICROANALYSIS, 2019, 25 (05) : 1106 - 1111
[7] A New Algorithm for Measuring the Young’s Modulus of Suspended Nanoobjects by the Bending-Based Test Method of Atomic Force Microscopy
A. V. Ankudinov
Semiconductors, 2019, 53 : 1891 - 1899
[8] A New Algorithm for Measuring the Young's Modulus of Suspended Nanoobjects by the Bending-Based Test Method of Atomic Force Microscopy
Ankudinov, A., V
SEMICONDUCTORS, 2019, 53 (14) : 1891 - 1899

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