Fabrication and Determination of Refractive Index Profile of the Planar Waveguides by Wedge Technique

被引：0

作者：

S. M. R. Sadat Hosseini

A. Darudi

机构：

[1] Institute for Advanced Studies in Basics Sciences

[2] Iran

[3] Iran Telecommunication Research Center

[4] P.O. Box 14155-3961

[5] P.O. Box 45195-159

[6] Tehran

[7] Zanjan

来源：

光学学报 | 2003年 / S1期

关键词：

of; in; In; as; for; by; that; Fabrication and Determination of Refractive Index Profile of the Planar Waveguides by Wedge Technique;

D O I：

暂无

中图分类号：

O436 [物理光学（波动光学）];

学科分类号：

070207 ; 0803 ;

摘要：

Several planar waveguides have been fabricated. The waveguides have been polished for determination of their refractive index profiles (RIP) by wedge method. The RIP determined by inserting the sample in a Mach-Zehnder interferometer and applying fringe analysis methods.

引用

页码：309 / 310

页数：2