Fast Diagnosis of Transient Plasma by Langmuir Probe

被引：12
|
作者：
唐恩凌 [1 ]
张庆明 [1 ]
欧阳吉庭 [2 ]
机构：
[1] State Key Laboratory of Explosion Science and Technology,Beijing Institute of Technology
[2] School of Science,Beijing Institute of Technology
来源：
Journal of Beijing Institute of Technology | 2007年 / 03期
关键词：
plasma diagnosis; Langmuir probe; transient plasma; sweep voltage;
D O I：
10.15918/j.jbit1004-0579.2007.03.025
中图分类号：
TH165.3 [];
学科分类号：
080202 ;
摘要：
A method for the fast measurement of electron temperature and density with temporal resolution in transient plasma has been implemented by Langmuir probe.The diagnostic system consists of a single Langmuir probe driven by a high frequency sinusoidal voltage.The current and voltage spectrum on the probe were detected synchronously by an oscilloscope with sampling rate being at least 5 times higher than the frequency of sweep voltage.The system has been used to diagnose the transient plasma generated by hypervelocity-impact of LY12 aluminum projectile into LY12 aluminum target.
引用
收藏
页码：375 / 378
页数：4
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