Novel silicon-controlled rectifier(SCR) for digital and high-voltage ESD power supply clamp
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作者:
ZHANG Peng
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机构:
Key Laboratory of Wide Band-Gap Semiconductor Materials and Devices,School of Microelectronics,Xidian UniversityKey Laboratory of Wide Band-Gap Semiconductor Materials and Devices,School of Microelectronics,Xidian University
ZHANG Peng
[1
]
WANG Yuan
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机构:
Key Laboratory of Microelectronic Devices and Circuits,Institute of Microelectronics,Peking UniversityKey Laboratory of Wide Band-Gap Semiconductor Materials and Devices,School of Microelectronics,Xidian University
WANG Yuan
[2
]
ZHANG Xing
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机构:
Key Laboratory of Microelectronic Devices and Circuits,Institute of Microelectronics,Peking UniversityKey Laboratory of Wide Band-Gap Semiconductor Materials and Devices,School of Microelectronics,Xidian University
ZHANG Xing
[2
]
MA XiaoHua
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机构:
Key Laboratory of Wide Band-Gap Semiconductor Materials and Devices,School of Microelectronics,Xidian UniversityKey Laboratory of Wide Band-Gap Semiconductor Materials and Devices,School of Microelectronics,Xidian University
MA XiaoHua
[1
]
HAO Yue
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机构:
Key Laboratory of Wide Band-Gap Semiconductor Materials and Devices,School of Microelectronics,Xidian UniversityKey Laboratory of Wide Band-Gap Semiconductor Materials and Devices,School of Microelectronics,Xidian University
HAO Yue
[1
]
机构:
[1] Key Laboratory of Wide Band-Gap Semiconductor Materials and Devices,School of Microelectronics,Xidian University
[2] Key Laboratory of Microelectronic Devices and Circuits,Institute of Microelectronics,Peking University
electrostatic discharge(ESD);
SCR;
latch-up immunity;
holding voltage;
power supply clamp;
high voltage;
D O I:
暂无
中图分类号:
TM461 [整流器];
学科分类号:
摘要:
Due to latch-up issue,the main problem of silicon-controlled rectifier(SCR)for power supply clamps in on-chip ESD protection is its inherent low holding voltage,especially in high-voltage applications.In this paper,we proposed a MOS-inside SCR(MISCR)showing nearly no snapback character and good ESD robustness,which is qualified for on-chip power clamp ESD protection.The stacked device achieves a series of triggering and holding voltage by altering the stacking number,which can also be used for the high voltage ESD power supply clamp applications.
机构:
Xidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R ChinaXidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R China
Zhang Peng
Wang Yuan
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h-index: 0
机构:
Peking Univ, Inst Microelect, Key Lab Microelect Devices & Circuits, Beijing 100871, Peoples R ChinaXidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R China
Wang Yuan
Zhang Xing
论文数: 0引用数: 0
h-index: 0
机构:
Peking Univ, Inst Microelect, Key Lab Microelect Devices & Circuits, Beijing 100871, Peoples R ChinaXidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R China
Zhang Xing
Ma XiaoHua
论文数: 0引用数: 0
h-index: 0
机构:
Xidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R ChinaXidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R China
Ma XiaoHua
Hao Yue
论文数: 0引用数: 0
h-index: 0
机构:
Xidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R ChinaXidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R China