Recent advances in dielectric breakdown theory of solid insulators

被引:0
|
作者
朱鹤孙
丁洪志
机构
[1] Beijing 100044
[2] Beijing 100081
[3] Beijing Graduate School
[4] Beijing Institute of Technology
[5] China
[6] North China Institute of Water Resources and Hydropower
[7] Research Centre of Materials Science
关键词
dielectric breakdown; dynamics; conducting microcrack; breakdown lifetime; fractal behaviour;
D O I
暂无
中图分类号
O442 [电动力学];
学科分类号
0808 ; 080805 ; 080904 ;
摘要
The phenomenon of dielectric breakdown in solid insulators has wide practical uses. Severaltheories, such as the well-known impact-ionization theory, avalanche theory and charge traptheory, have been proposed for this phenomenon. These are great achievements in such a well-recognized complicated subject. However, at present there exists no integrated and complete theo-ry to really reflect the overall process of dielectric breakdown, which obviously can be attributedto the complexity of the problem itself. All the existing breakdown mechanisms mainly focus on
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页码:2 / 13
页数:12
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