Laser-induced thermo-compression bonding for Cu–Au heterogeneous nanojoining

被引:0
|
作者
Hui Wan [1 ,2 ]
Yu Shu [3 ]
Shuo Chen [3 ]
Hao Cao [3 ]
Shengjun Zhou [1 ]
Sheng Liu [1 ,3 ,4 ]
Chengqun Gui [3 ]
机构
[1] School of Power and Mechanical Engineering, Wuhan University
[2] Hubei Key Laboratory of Electronic Manufacturing and Packaging Integration, Wuhan University
[3] The Institute of Technological Sciences, Wuhan University
[4] The Key Laboratory of Transients in Hydraulic Machinery of Ministry of Education, Wuhan
关键词
D O I
暂无
中图分类号
TB383.1 []; TN249 [激光的应用]; TN05 [制造工艺及设备];
学科分类号
摘要
Surface tension-induced shrinkage of heterogeneously bonded interfaces is a key factor in limiting the performance of nanostructures. Herein, we demonstrate a laser-induced thermo-compression bonding technology to suppress surface tension-induced shrinkage of Cu–Au bonded interface. A focused laser beam is used to apply localized heating and scattering force to the exposed Cu nanowire. The laser-induced scattering force and the heating can be adjusted by regulating the exposure intensity. When the ratio of scattering forces to the gravity of the exposed nanowire reaches 3.6×10~3, the molten Cu nanowire is compressed into flattened shape rather than shrinking into nanosphere by the surface tension. As a result, the Cu–Au bonding interface is broadened fourfold by the scattering force, leading to a reduction in contact resistance of approximately 56%. This noncontact thermo-compression bonding technology provides significant possibilities for the interconnect packaging and integration of nanodevices.
引用
收藏
页码:415 / 425
页数:11
相关论文
共 50 条
  • [1] Laser-induced thermo-compression bonding for Cu-Au heterogeneous nanojoining
    Wan, Hui
    Shu, Yu
    Chen, Shuo
    Cao, Hao
    Zhou, Shengjun
    Liu, Sheng
    Gui, Chengqun
    INTERNATIONAL JOURNAL OF EXTREME MANUFACTURING, 2025, 7 (01)
  • [2] Cu-Cu Thermo-compression Bonding for TSV Integration
    Kim, B.
    Matthias, T.
    Burgstaller, D.
    Zhu, S.
    Kettner, P.
    Jang, E. J.
    Kim, J. W.
    Park, Y. B.
    CHINA SEMICONDUCTOR TECHNOLOGY INTERNATIONAL CONFERENCE 2010 (CSTIC 2010), 2010, 27 (01): : 813 - 818
  • [3] Advances in thermo-compression bonding
    Garrou, Phil
    SOLID STATE TECHNOLOGY, 2015, 58 (06) : 12 - 12
  • [4] The Synergistic Roles of Temperature and Pressure in Thermo-Compression Bonding of Au
    Ambhore, P.
    Mani, K.
    Beekley, B.
    Malik, N.
    Schjolberg-Henriksen, K.
    Iyer, S.
    Goorsky, M. S.
    SEMICONDUCTOR WAFER BONDING: SCIENCE, TECHNOLOGY, AND APPLICATIONS 15, 2018, 86 (05): : 129 - 135
  • [5] Characterization of Interfacial Adhesion of Cu-Cu Bonding Fabricated by Thermo-Compression Bonding Process
    Kim, Kwang-Seop
    Lee, Hee-Jung
    Kim, Hee-Yeoun
    Kim, Jae-Hyun
    Hyun, Seungmin
    Lee, Hak-Joo
    TRANSACTIONS OF THE KOREAN SOCIETY OF MECHANICAL ENGINEERS A, 2010, 34 (07) : 929 - 933
  • [6] A thermodynamic study of voiding phenomena in Cu–Cu thermo-compression wafer bonding
    B. Rebhan
    J. Svoboda
    M. Panholzer
    Microsystem Technologies, 2018, 24 : 815 - 822
  • [7] A thermodynamic study of voiding phenomena in Cu-Cu thermo-compression wafer bonding
    Rebhan, B.
    Svoboda, J.
    Panholzer, M.
    MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS, 2018, 24 (01): : 815 - 822
  • [8] Thermo-compression bonding of alumina ceramics to metal
    Das, S
    Tiwari, AN
    Kulkarni, AR
    JOURNAL OF MATERIALS SCIENCE, 2004, 39 (10) : 3345 - 3355
  • [9] Thermo-compression bonding of alumina ceramics to metal
    S. Das
    A. N. Tiwari
    A. R. Kulkarni
    Journal of Materials Science, 2004, 39 : 3345 - 3355
  • [10] Die shear strength as a function of bond frame geometry - Au-Au thermo-compression bonding
    Tollefsen, Torleif Andre
    Larsson, Andreas
    Taklo, Maaike Margrete Visser
    Poppe, Erik
    Schjolberg-Henriksen, Kari
    2012 4TH ELECTRONIC SYSTEM-INTEGRATION TECHNOLOGY CONFERENCE (ESTC), 2012,