Anchor loss in weakly coupled resonator systems of mode-localized sensor based on perfectly matched layer method

被引:0
|
作者
Cheng, Rongjun [1 ,2 ]
Zhang, Wenlong [1 ,2 ]
Yuan, Yi [1 ,2 ]
Huang, Qiangxian [1 ,2 ]
Zhang, Liansheng [1 ,2 ]
Li, Hongli [1 ,2 ]
机构
[1] Hefei Univ Technol, Anhui Prov Key Lab Measuring Theory & Precis Instr, Hefei 230009, Anhui, Peoples R China
[2] Hefei Univ Technol, Anhui Prov Engn Res Ctr Semicond Inspect Technol &, Hefei 230009, Anhui, Peoples R China
来源
MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS | 2024年
基金
中国国家自然科学基金;
关键词
BEAM RESONATORS; SUPPORT LOSS;
D O I
10.1007/s00542-024-05828-3
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The performance of mode-localized sensors highly depends on the rate of vibrational energy dissipation, and anchor loss is one of the major dissipation sources for vacuum-encapsulated sensors. To study anchor energy loss in weakly coupled resonator systems, the Perfectly Matched Layer (PML) method is utilized to investigate the influence of key factors on the anchor loss quality factor of mode-localized sensors, including the size and position of the coupled beam, the resonator dimensions, and the material properties of weakly coupled resonator. The results indicate that increasing the ratio of Young's modulus between the substrate and resonator beam can improve the quality factor by approximately 7.4 times, enhancing the length-to-width ratio of the resonator beam can increase the quality factor by up to 14 times. Additionally, reducing the width of the coupled beam by 80 % doubles the quality factor. Moreover, the anchor loss is influenced not only by the local stress distribution near the substrate, but also increases with the eigenfrequency of the resonator, while changes in stiffness of equivalent dynamic stiffness alter the vibrational energy distribution at the anchor. These findings can provide valuable references for the design and optimization of mode-localized sensors.
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页数:11
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