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Quantum super-resolution imaging: a review and perspective
被引:0
|作者:
Yue, Xiaoran
[1
,2
]
Wu, Hui
[1
]
Wang, Jizhou
[3
]
He, Zhe
[1
]
机构:
[1] Shandong Inst Adv Technol, Jinan 250000, Peoples R China
[2] Univ Rochester, Rochester, NY 14620 USA
[3] Texas A&M Univ, College Stn, TX 77840 USA
来源:
关键词:
quantum imaging;
super-resolution imaging;
quantum entanglement;
STIMULATED-EMISSION;
FLUORESCENCE MICROSCOPY;
ULTRABRIGHT SOURCE;
RESOLUTION LIMIT;
STED MICROSCOPY;
ENTANGLEMENT;
D O I:
10.1515/nanoph-2024-0597
中图分类号:
TB3 [工程材料学];
学科分类号:
0805 ;
080502 ;
摘要:
Quantum super-resolution imaging provides a nonlabeling method to surpass the diffraction limit of imaging systems. This technique relies on measurement of the second-order correlation function and usually employs spatially entangled photon sources. We introduce recent methods that achieve spatial resolution enhancement through quantum approaches, particularly the imaging techniques utilizing biphoton states. The fundamental mechanisms are discussed in detail to explain why biphoton states enable super-resolution. Additionally, we introduce multiple algorithms that extract the correlation function from the readings of two-dimensional detectors. Several cases are reviewed to evaluate the advantages and prospects of quantum imaging, along with a discussion of practical developments and potential applications.
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页数:14
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