From atom-based RF metrology to quantum RF receivers and emitters

被引:0
|
作者
Latypov, Damir [1 ]
机构
[1] Cornerstone Res Grp Inc, Aerosp Syst Ctr, Miamisburg, OH 45342 USA
来源
IEEE NATIONAL AEROSPACE AND ELECTRONICS CONFERENCE, NAECON 2024 | 2024年
关键词
Rydberg atom; quantum emitter; VLF; electrically small antenna; submarine communication; radio recombination lines;
D O I
10.1109/NAECON61878.2024.10670667
中图分类号
V [航空、航天];
学科分类号
08 ; 0825 ;
摘要
Recent research in Rydberg atom-based RF metrology and RF receivers is briefly summarized. Main focus of the paper is on a novel Rydberg atom-based emitter which holds significant promise across various applications. Quantum emitters offer well-known advantages, including a high degree of coherence, superradiance, and single photon sources. A particularly intriguing possibility is a low-frequency Rydberg atom-based emitter, which could overcome the Chu-Harrington limit on the Q-factor of electrically small RF antennas. A compact very low frequency (VLF) quantum emitter could have diverse applications ranging from establishing RF links between submerged submarines and air platforms to sounding the ionosphere and magnetosphere from space platforms. Additionally, it could play a role in controlling the population of relativistic electrons in radiation belts, ensuring the safety of space assets during space weather events. Naturally occurring in space, low-frequency Rydberg atom-based emitters manifest themselves through phenomena like radio recombination lines (RRL) and astrophysical masers.
引用
收藏
页码:80 / 82
页数:3
相关论文
共 50 条
  • [1] Atom-based RF electric field metrology above 100 GHz
    Simons, Matt T.
    Gordon, Joshua A.
    Holloway, Christopher L.
    TERAHERTZ, RF, MILLIMETER, AND SUBMILLIMETER-WAVE TECHNOLOGY AND APPLICATIONS IX, 2016, 9747
  • [2] Atom-Based RF Electric Field Metrology: From Self-Calibrated Measurements to Subwavelength and Near-Field Imaging
    Holloway, Christopher L.
    Simons, Matthew T.
    Gordon, Joshua A.
    Wilson, Perry F.
    Cooke, Caitlyn M.
    Anderson, David A.
    Raithel, Georg
    IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, 2017, 59 (02) : 717 - 728
  • [3] Uncertainties in Rydberg Atom-based RF E-field Measurements
    Simons, Matthew T.
    Kautz, Marcus D.
    Gordon, Joshua A.
    Holloway, Christopher L.
    2018 INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (EMC EUROPE), 2018, : 376 - 380
  • [4] Atom-Based RF Electric Field Measurements: An Initial Investigation of the Measurement Uncertainties
    Holloway, Christopher L.
    Gordon, Joshua A.
    Simons, Matt T.
    Fan, Haoquan
    Kumar, Santosh
    Shaffer, James P.
    Anderson, David A.
    Schwarzkopf, Andrew
    Miller, Stephanie A.
    Thaicharoen, Nithiwadee
    Raithel, Georg
    2015 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (EMC), 2015, : 467 - 472
  • [5] Rydberg Atom-Based Sensors: Transforming SI-Traceable Measurements from RF fields to Thermometry
    Holloway, Christopher L.
    Simons, Matthew T.
    Prajapati, Nikunjkumar
    Berweger, Samuel
    Rotunno, Andrew P.
    Artusio-Glimpse, Alexandra B.
    Schlossberger, Noah
    Shylla, Dangka
    Watterson, William J.
    Norrgard, Eric B.
    Eckel, Stephen P.
    2024 IEEE INC-USNC-URSI RADIO SCIENCE MEETING (JOINT WITH AP-S SYMPOSIUM), 2024, : 122 - 122
  • [7] RF E-field Sensing Using Rydberg Atom-Based Microwave Electrometry
    Monika
    Rawat, Harish Singh
    Dubey, Satya Kesh
    MAPAN-JOURNAL OF METROLOGY SOCIETY OF INDIA, 2020, 35 (04): : 555 - 562
  • [8] RF E-field Sensing Using Rydberg Atom-Based Microwave Electrometry
    Harish Singh Monika
    Satya Kesh Rawat
    MAPAN, 2020, 35 : 555 - 562
  • [9] Atom-Based RF Field Probe: From Self-Calibrated Measurements to Sub-Wavelength Imaging
    Holloway, Christopher L.
    Gordon, Josh A.
    Simons, Matt T.
    Anderson, David A.
    Schwarzkopf, Andrew
    Miller, Stephanie A.
    Thaicharoen, Nithiwadee
    Raithel, Georg
    2015 IEEE 15TH INTERNATIONAL CONFERENCE ON NANOTECHNOLOGY (IEEE-NANO), 2015, : 789 - 791
  • [10] Optical lattices for atom-based quantum microscopy
    Klinger, Andreas
    Degenkolb, Skyler
    Gemelke, Nathan
    Soderberg, Kathy-Anne Brickman
    Chin, Cheng
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2010, 81 (01):