In situ investigation of thermal resistance of resistance temperature detectors

被引：0
|
作者：
Pawlowski, Eligiusz [1 ]
机构：
[1] Politech Lubelska, Katedra Automatyki & Metrol, Wydzial Elektrotech & Informatyki, Ul Nadbystrzycka 38A, PL-20618 Lublin, Poland
来源：
PRZEGLAD ELEKTROTECHNICZNY | 2024年 / 100卷 / 12期
关键词：
resistance temperature detectors RTD; self-heating effect; thermal resistance; in situ research; UNCERTAINTY;
D O I：
10.15199/48.2024.12.56
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In resistance temperature detectors, such as the popular Pt100, the self-heating effect causes temperature measurement errors. The value of these errors depends on the sensor's measuring current and thermal resistance. The measuring current of a Pt100 sensor shall be limited to a value at which the self-heating does not exceed 25 % of the tolerance value of the declared tolerance class. Meeting this requirement requires knowledge of the in situ thermal resistance of the sensor.
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页码：260 / 263
页数：4
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