The Impact of Device Technologies on the Design of Non-Volatile Content Addressable Memories

被引:0
|
作者
Moon, Sabrina Hassan [1 ]
Dutta, Prayash [2 ]
Khorrami, Parsa [1 ]
Bhanja, Sanjukta [2 ]
Reis, Dayane [1 ]
机构
[1] Univ S Florida, Dept Comp Sci & Engn, Tampa, FL 33620 USA
[2] Univ S Florida, Dept Elect Engn, Tampa, FL 33620 USA
来源
2024 IEEE 24TH INTERNATIONAL CONFERENCE ON NANOTECHNOLOGY, NANO 2024 | 2024年
关键词
MRAM; TCAM;
D O I
10.1109/NANO61778.2024.10628710
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Content Addressable Memories (CAMs) are employed in the design of computing-in-memory (CiM) accelerators for data-intensive applications due to their ability to perform massively parallel searches. This paper presents a study of different device technologies, i.e., resistive RAMs (ReRAMs), ferroelectric field-effect transistors (FeFETs), and magnetoresistive random access memory (MRAMs) that are leveraged in the development of dense and energy-efficient non-volatile content addressable memories (NVCAMs). We leverage data from our own research and that of others to present a comprehensive evaluation of different NVCAMs and compare their power consumption, area efficiency, speed, and endurance with respect to CMOS-based CAM counterparts. Additionally, we explore potential application scenarios that map to the unique strengths of the various NVCAMs. Our discussion highlights pathways for future research on the application mapping of NVCAM designs for CiM architectures.
引用
收藏
页码:513 / 516
页数:4
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