STRUCTURAL-ANALYSIS OF SILICON-IMPLANTED POLY(METHYL METHACRYLATE FILMS ON GLASS

被引：2
|
作者：
BLEIL, CE
MACIVER, BA
机构：
来源：
JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1984年 / 131卷 / 03期
关键词：
D O I：
10.1149/1.2115640
中图分类号：
O646 [电化学、电解、磁化学];
学科分类号：
081704 ;
摘要：
引用
收藏
页码：623 / 627
页数：5
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