A Deep Learning-based Generic Solder Defect Detection System

被引:1
|
作者
Ye, Shi-Qi [1 ]
Xue, Chen-Sheng [1 ]
Jian, Cheng-Yuan [1 ]
Chen, Yi-Zhen [1 ]
Gung, Jia-Jiun [1 ]
Lin, Chia-Yu [1 ]
机构
[1] Yuan Ze Univ, Dept Comp Sci & Engn, Taoyuan, Taiwan
关键词
D O I
10.1109/ICCE-TAIWAN55306.2022.9869217
中图分类号
TP39 [计算机的应用];
学科分类号
081203 ; 0835 ;
摘要
Automated optical inspection (AOI) is essential in the electronic manufacturing production line. Strict screening rules lead to a high false alarm rate of AOI. Many industries use AI models to classify defects. The lack of flawed data and the uneven distribution of categories is a big challenge for model training. Furthermore, the AI model must be retrained when adding new production line data, and the time cost is high. In order to reduce the false alarm rate and improve the generalization of the AI model, we build a deep learning-based generic solder defect detection system (GSDD) to classify defects into seven types. In GSDD, the color gradation adjustment module solves the problem of color difference, and the data augmentation module solves the problem of variable data. In the experiment, we use the data set provided by the enterprise to evaluate the accuracy of the model to 96%, and the model can be applied to different machines. Thus, GSDD is a general model and can efficiently detect defects.
引用
收藏
页码:99 / 100
页数:2
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