Investigation of the effects of deposition scan patterns on STS 316L thin-wall structures in directed energy deposition

被引:0
|
作者
Han, Jisu [1 ,2 ]
Yang, Jeongho [1 ]
Eo, Du-Rim [1 ]
Kang, Dongseok [1 ]
Yeon, Simo [1 ]
Hong, Sukjoon [3 ]
Lee, Hyub [1 ]
机构
[1] Korea Inst Ind Technol KITECH, Customized Mfg R&D Dept, 113-58 Seohaean Ro, Shihung 15014, South Korea
[2] Hanyang Univ, HYU KITECH Joint Dept, Major Machinery Convergence & 3D Printing, 222 Wangsimni Ro, Seoul, South Korea
[3] Hanyang Univ, BK21 FOUR ER ACE Ctr, Dept Mech Engn, 55 Hanyangdaehak Ro, Ansan 15588, South Korea
关键词
Additive manufacturing; Directed energy deposition; Scan pattern; Melt pool dynamics; Computational fluid dynamics; STRENGTH;
D O I
10.1007/s00170-025-15382-5
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
This study investigates the effects of deposition scan pattern on the fabrication of thin-wall structures using laser powder directed energy deposition (LP-DED). Two distinct deposition patterns-sequential (SP) and center-out (COP)-were evaluated in terms of their influence on bead formation, thermal behavior, and mechanical properties. The sequential pattern resulted in significant asymmetry in bead shape and a greater temperature gradient, while the center-out pattern achieved a more balanced flow, leading to more uniform bead formation. Experimental results showed that the center-out pattern minimized distortion, with a maximum deviation of 0.2 mm for a thin-wall structure of 100 mm in height, compared to the sequential pattern with a maximum deviation of 5.5 mm. Electron backscatter diffraction (EBSD) analysis further revealed that the grain size in the COP method was approximately 40% smaller than that in the SP method, and the primary dendrite arm spacing (PDAS) was 25% smaller, resulting in a more refined microstructure. As a consequence, the COP method led to a 4.9% increase in hardness and achieved a higher density of 99.9% compared to 99.7% in the SP method. This study highlights the importance of choosing an appropriate deposition scan pattern for improving the quality of thin-wall structures fabricated by DED, offering insights into reducing deformation and optimizing microstructure and material properties.
引用
收藏
页码:3727 / 3741
页数:15
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