Surface study by x-ray scattering technique and phase contrast imaging: the examples of graphene and sapphire

被引：0

作者：

Argunova, Tatiana S. ^{[1
]}

Kohn, Victor G. ^{[2
]}

Roshchin, Boris S. ^{[2
]}

Nuzhdin, Alexander D. ^{[2
]}

Lim, Jae-Hong ^{[3
]}

Lebedev, Sergey P. ^{[1
]}

Ankudinov, Alexander V. ^{[1
]}

机构：

[1] Ioffe Institute, Saint-Petersburg, Russia

[2] National Research Centre Kurchatov Institute, Moscow, Russia

[3] Pohang Accelerator Laboratory, Pohang, Korea, Republic of

来源：

Materials Physics and Mechanics | 2024年 / 52卷 / 05期

关键词：

The work of T.S. Argunova and S.P. Lebedev was carried out with the support of the Ministry of Science and Higher Education of the Russian Federation (agreement No 075-15-2021-1349). The work of V.G. Kohn was carried out within the state assignment of National Research Centre Kurchatov Institute;

D O I：

10.18149/MPM.5252024_7

中图分类号：

学科分类号：

摘要：

引用

页码：64 / 73

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