The Effect of H+ Fluence Irradiation on the Optical, Structural, and Morphological Properties of ZnO Thin Films

被引：0
|
作者：
López-Suárez, Alejandra [1 ]
Cruz-Delgado, Yaser D. [1 ]
Acosta, Dwight R. [1 ]
López-Patiño, Juan [2 ]
Fuentes, Beatriz E. [2 ]
机构：
[1] Instituto de Física, Universidad Nacional Autónoma de México, A.P. 20-364, Ciudad de México 01000, Mexico
[2] Departamento de Física, Facultad de Ciencias, Universidad Nacional Autónoma de México, Ciudad de México,04510, Mexico
来源：
Materials | 2024年 / 17卷 / 24期
关键词：
Rutherford backscattering spectroscopy;
D O I：
10.3390/ma17246095
中图分类号：
学科分类号：
摘要：
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