Some remarks on the use of SHG in nickel surface roughness inspection

被引：0
|
作者：
Peiponen, K.-E. [1 ]
Silfsten, P. [1 ]
Riihola, P. [1 ]
Vartiainen, E.M. [1 ]
Asakura, T. [1 ]
Salminen, O. [1 ]
机构：
[1] Univ of Joensuu, Joensuu, Finland
来源：
Optik (Jena) | 1993年 / 94卷 / 04期
关键词：
Nickel - Optical instruments - Optical properties - Probes - Second harmonic generation;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Second-harmonic generation from nickel surface roughness standards was investigated. The use of SHG as an optical probe for engineering purposes is discussed.
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页码：177 / 179
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