ARE THE DAYS NUMBERED FOR PLATED-WIRE MEMORIES?

被引：0

作者：

Iversen, Wesley R.

机构：

来源：

Electronics | 1987年 / 60卷 / 20期

关键词：

BIPOLAR INTERFACE CIRCUITRY - NONDESTRUCTIVE READOUT - PERMALLOY MAGNETS - RADIATION HARDNESS - THIN-FILM MAGNETIC ARRAY - THIN-FILM SPUTTERING TECHNIQUE;

D O I：

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摘要：

引用

共 50 条

[1] ARE THE DAYS NUMBERED FOR PLATED-WIRE MEMORIES
IVERSEN, WR
ELECTRONICS-US, 1987, 60 (20): : 31 - 31
[2] RELIABILITY OF PLATED-WIRE MEMORIES
SUGANUMA, Y
FURUOYA, T
NEC RESEARCH & DEVELOPMENT, 1969, (13): : 47 - &
[3] SEMICONDUCTORS FOR PLATED-WIRE MEMORIES
BRUNNER, D
ELECTRONIC PRODUCTS MAGAZINE, 1971, 14 (05): : 50 - &
[4] PLATED-WIRE MEMORIES - PROBLEMS AND PROGRESS
FEDDE, GA
IEEE TRANSACTIONS ON MAGNETICS, 1972, MAG8 (03) : 620 - 624
[5] PLATED-WIRE MEMORIES FOR INDUSTRIAL CONTROL.
Yumoto, H.D.
Machine Design, 1981, 53 (25) : 125 - 127
[6] STRESS RELIEF MECHANISM OF AGING IN PLATED-WIRE MEMORIES
LUTES, OS
HOLMEN, JO
ULMER, RP
IEEE TRANSACTIONS ON MAGNETICS, 1970, MAG6 (04) : 785 - +
[7] DESIGN OF SMALL PLATED-WIRE MEMORIES WITH HIGH RELIABILITY
SATO, W
MIYOSHI, T
MORI, N
KUBO, T
KOBAYASH.H
NEC RESEARCH & DEVELOPMENT, 1972, (26): : 122 - +
[8] STRESS RELIEF MECHANISM OF AGING IN PLATED-WIRE MEMORIES
LUTES, OS
HOLMEN, JO
ULMER, RP
IEEE TRANSACTIONS ON MAGNETICS, 1970, MAG6 (03) : 721 - &
[9] PLATED-WIRE MEMORIES - HOW FAR CAN WE GO
MCCALLISTER, JP
IEEE TRANSACTIONS ON MAGNETICS, 1970, MAG6 (03) : 525 - +
[10] PLATED-WIRE MEMORIES - UNIVACS BET TO REPLACE TOROIDAL FERRITE CORES
FEDDE, GA
ELECTRONICS, 1967, 40 (10): : 101 - &

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