Characterization of the microstructure of deformed Al-Zn-Cu alloys by x-ray diffraction line profile analysis

The well-established technique of X-ray diffraction line profile analysis was used to characterize the microstructure in the plastically deformed state of ternary α-phase Al-Sn-Cu alloys prepared using spectroscopically pure metals. Result of the present study indicate that unlike pure Al and binary Al-base alloys, ternary Al-base An-Zn-Cu alloy can be deformed to the extent so as to produce stacking faults with solute Cu exerting greater influence in controlling the deformed substructure than Zn.