Flux creep characteristics after the increase in temperature or external field

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机构：
[1] Chen, T.L.
[2] Hsu, S.W.
[3] Chen, Y.C.
[4] Lee, W.H.
[5] Chu, J.J.
来源：
Chen, T.L. | 1600年 / Publ by Elsevier Science Publ BV (North-Holland), Amsterdam, Netherlands卷 / 185-89期
关键词：
Flux Creep - Oxide Superconductors - Yttrium Barium Copper Oxides;
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