共 50 条
- [6] Model of optoelectronic measuring intelligent system 2003 INTERNATIONAL CONFERENCE PHYSICS AND CONTROL, VOLS 1-4, PROCEEDINGS: VOL 1: PHYSICS AND CONTROL: GENERAL PROBLEMS AND APPLICATIONS; VOL 2: CONTROL OF OSCILLATIONS AND CHAOS; VOL 3: CONTROL OF MICROWORLD PROCESSES. NANO- AND FEMTOTECHNOLOGIES; VOL 4: NONLINEAR DYNAMICS AND CONTROL, 2003, : 172 - 175
- [10] NEW PLATE PROFILE MEASURING SYSTEM. MPT. Metallurgical plant and technology, 1988, 11 (02): : 56 - 57