Space-charge physics and the breakdown process

被引：0
|
作者：
机构：
来源：
| 1600年 / American Inst of Physics, Woodbury, NY, USA卷 / 77期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [1] SPACE-CHARGE PHYSICS AND THE BREAKDOWN PROCESS
    BLAISE, G
    JOURNAL OF APPLIED PHYSICS, 1995, 77 (07) : 2916 - 2927
  • [2] CALCULATIONS OF SPACE-CHARGE CONTROLLED BREAKDOWN
    KLINE, LE
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1973, 18 (05): : 805 - 805
  • [3] DIELECTRIC-BREAKDOWN AND SPACE-CHARGE IN PERSPEX
    WATSON, DB
    PIN, BH
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1978, 11 (02) : L33 - L34
  • [4] INFLUENCE OF SPACE-CHARGE ON BREAKDOWN STRENGTH OF PET FOIL
    KROWINSKI, A
    KACPRZYK, A
    LOWKIS, B
    WOJCIK, K
    PROCEEDINGS OF THE 3RD INTERNATIONAL CONFERENCE ON CONDUCTION AND BREAKDOWN IN SOLID DIELECTRICS, 1989, : 369 - 373
  • [5] ELECTRICAL BREAKDOWN AND SPACE-CHARGE OF POLYPHENYLENE SULFIDE FILMS
    MIZUTANI, T
    HIKITA, M
    UMEMURA, A
    IEDA, M
    IEEE 1989 ANNUAL REPORT: CONFERENCE ON ELECTRICAL INSULATION AND DIELECTRIC PHENOMENA, 1989, : 315 - 320
  • [6] HVDC BREAKDOWN OF TRANSFORMER OIL AND THE EFFECT OF SPACE-CHARGE ON IT
    OHSHIMA, I
    MOTEGI, S
    HONDA, M
    YANARI, T
    EBISAWA, Y
    IEEE TRANSACTIONS ON POWER APPARATUS AND SYSTEMS, 1983, 102 (07): : 2208 - 2215
  • [7] The influence of space-charge on the breakdown in SF6
    Hinterholzer, T
    Taschner, W
    Boeck, W
    GASEOUS DIELECTRICS IX, 2001, : 383 - 389
  • [8] Space-Charge Modulated Electrical Breakdown in Polyethylene Nanodielectrics
    Min, Daomin
    Yan, Chenyu
    Mi, Rui
    Cui, Haozhe
    Li, Yuwei
    Wang, Weiwang
    Frechette, Michel
    Li, Shengtao
    IEEE NANOTECHNOLOGY MAGAZINE, 2018, 12 (02) : 15 - 22
  • [9] AVALANCHE BREAKDOWN IN A DIODE WITH A LIMITED SPACE-CHARGE LAYER
    GRIBNIKOV, ZS
    SOVIET PHYSICS-SOLID STATE, 1960, 2 (05): : 782 - 784
  • [10] EFFECT OF SPACE-CHARGE AND STRUCTURE ON BREAKDOWN OF LIQUID AND SOLID
    INUISHI, Y
    IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1982, 17 (06): : 488 - 492
12345