Single Crystal CuInSe2 Analysis by High Resolution XPS

被引：0
|
作者：
Sobol, P.E. [1 ]
Nelson, A.J. [2 ]
Schwerdtfeger, C.R. [2 ]
Stickle, W.F. [3 ]
Moulder, J.F. [3 ]
机构：
[1] Perkin-Elmer Physical Electronics Laboratory, Eden Prairie,MN,55344, United States
[2] National Renewal Energy Laboratory, Golden,CO,80401, United States
[3] Perkin-Elmer Physical Electronics Laboratory, Eden Prairie,MN,55344, United States
来源：
Surface Science Spectra | 1992年 / 1卷 / 04期
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D O I：
10.1116/1.1247638
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页码：393 / 397
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