Structural investigations of GaAs/AlAs quantum wires and quantum dots by x-ray reciprocal space mapping

被引:0
|
作者
机构
来源
| 1600年 / Institute of Physics Publishing Ltd, Bristol, Engl卷 / 28期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [1] STRUCTURAL INVESTIGATIONS OF GAAS/ALAS QUANTUM WIRES AND QUANTUM DOTS BY X-RAY RECIPROCAL SPACE MAPPING
    DARHUBER, AA
    KOPPENSTEINER, E
    BAUER, G
    WANG, PD
    SONG, YP
    TORRES, CMS
    HOLLAND, MC
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1995, 28 (4A) : A195 - A199
  • [2] X-RAY RECIPROCAL SPACE MAPPING OF GAAS/ALAS QUANTUM WIRES AND QUANTUM DOTS
    DARHUBER, AA
    KOPPENSTEINER, E
    BAUER, G
    WANG, PD
    SONG, YP
    TORRES, CMS
    HOLLAND, MC
    APPLIED PHYSICS LETTERS, 1995, 66 (08) : 947 - 949
  • [3] Shear strains in dry etched GaAs/AlAs wires studied by high resolution x-ray reciprocal space mapping
    Darhuber, AA
    Bauer, G
    Wang, PD
    Torres, CMS
    JOURNAL OF APPLIED PHYSICS, 1998, 83 (01) : 126 - 131
  • [5] X-ray diffraction from quantum wires and quantum dots
    Y. Zhuang
    J. Stangl
    A. A. Darhuber
    G. Bauer
    P. Mikuli´k
    V. Holy´
    N. Darowski
    U. Pietsch
    Journal of Materials Science: Materials in Electronics, 1999, 10 : 215 - 221
  • [6] X-ray diffraction from quantum wires and quantum dots
    Zhuang, Y
    Stangl, J
    Darhuber, AA
    Bauer, G
    Mikulík, P
    Holy, V
    Darowski, N
    Pietsch, U
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 1999, 10 (03) : 215 - 221
  • [7] Structural investigations of shadow masks by means of x-ray reciprocal space mapping
    Ress, HR
    Gerhard, T
    Schumacher, C
    Hock, V
    Li, M
    Korn, M
    Faschinger, W
    Landwehr, G
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1999, 32 (10A) : A26 - A31
  • [8] X-ray atomic mapping of quantum dots
    Dey, Arka B.
    Sanyal, Milan K.
    Keane, Denis T.
    Campbell, Gavin P.
    Liu, Bo-Hong
    Farrer, Ian
    Ritchie, David A.
    Bedzyk, Michael J.
    PHYSICAL REVIEW MATERIALS, 2020, 4 (05)
  • [9] Elastic strains in GaAs/AlAs quantum dots studied by high resolution x-ray diffraction
    Masaryk Univ, Brno, Czech Republic
    Solid State Electron, 1-8 (373-377):
  • [10] Elastic strains in GaAs/AlAs quantum dots studied by high resolution X-ray diffraction
    Holy, V
    Darhuber, AA
    Bauer, G
    Wang, PD
    Song, YP
    Torres, CMS
    Holland, MC
    SOLID-STATE ELECTRONICS, 1996, 40 (1-8) : 373 - 377