Relationship of grain nanostructure and orientation in whisker growth on aluminum thin films on glass substrates

被引：0
|
作者：
Display Technology, IBM Japan. Ltd., Shimotsumma, Yamtito-shi, Kanagawa 242-8502, Japan [1 ]
不详 [2 ]
机构：
来源：
Thin Solid Films | / 461-464期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [1] Relationship of grain nanostructure and orientation in whisker growth on aluminum thin films on glass substrates
    Takatsuija, H
    Tsujimoto, K
    Kuroda, K
    Saka, H
    THIN SOLID FILMS, 1999, 343 : 461 - 464
  • [2] The study of preferred orientation growth of aluminum nitride thin films on ceramic and glass substrates
    Kao, HL
    Shih, PJ
    Lai, CH
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1999, 38 (3A): : 1526 - 1529
  • [3] Correlation between surface whisker growth and interfacial precipitation in aluminum thin films on silicon substrates
    Dutta, I.
    Burkhard, M.
    Kuwano, S.
    Fujita, T.
    Chen, M. W.
    JOURNAL OF MATERIALS SCIENCE, 2010, 45 (12) : 3367 - 3374
  • [4] Correlation between surface whisker growth and interfacial precipitation in aluminum thin films on silicon substrates
    I. Dutta
    M. Burkhard
    S. Kuwano
    T. Fujita
    M. W. Chen
    Journal of Materials Science, 2010, 45 : 3367 - 3374
  • [5] EFFECTS OF GRAIN-ORIENTATION ON HILLOCK FORMATION AND GRAIN-GROWTH IN ALUMINUM FILMS ON SILICON SUBSTRATES
    SANCHEZ, JE
    ARZT, E
    SCRIPTA METALLURGICA ET MATERIALIA, 1992, 27 (03): : 285 - 290
  • [6] Effects of grain orientation on abnormal grain growth in bcc-polycrystalline thin films on rigid substrates
    Zhang, JM
    Xu, KW
    JOURNAL OF MATERIALS SCIENCE LETTERS, 1999, 18 (12) : 939 - 941
  • [7] Effects of grain orientation on abnormal grain growth in bcc-polycrystalline thin films on rigid substrates
    Stt.-Key Lab. Mech. Behav. of Mat., Xi'an Jiaotong University, Xi'an 710049, China
    不详
    J Mater Sci Lett, 12 (939-941):
  • [8] Whisker growth on aluminum thin films during heat treatment
    Hinode, K
    Homma, Y
    Sasaki, Y
    STRESS INDUCED PHENOMENA IN METALLIZATION - FOURTH INTERNATIONAL WORKSHOP, 1998, (418): : 359 - 370
  • [9] Relationship between the void and hillock formation and the grain growth in thin aluminum films
    Kononenko, OV
    Matveev, VN
    MATERIALS RELIABILITY IN MICROELECTRONICS VI, 1996, 428 : 493 - 498
  • [10] Morphology and structure of aluminum nitride thin films on glass substrates
    Cheng, Chien-Chuan
    Chen, Ying-Chung
    Wang, Horng-Jwo
    Chen, Wen-Rong
    Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers, 1996, 35 (03): : 1880 - 1885
12345