共 50 条
- [3] Magnetic force microscopy signatures of defects in current-carrying lines ELECTRICALLY BASED MICROSTRUCTURAL CHARACTERIZATION III, 2002, 699 : 107 - 112
- [4] Calibrated magnetic force microscopy measurement of current-carrying lines JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2001, 19 (04): : 1763 - 1768
- [6] Calibration of magnetic force microscopy using micron size straight current wires 1600, American Institute of Physics Inc. (91):