Application of x-ray reflectometry in study of nonideal Si/Si1-xGex superlattices

被引：0
|
作者：
机构：
来源：
| 1600年 / 72期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [1] APPLICATION OF X-RAY REFLECTOMETRY IN STUDY OF NONIDEAL SI/SI1-X-GEX SUPERLATTICES
    BARIBEAU, JM
    JOURNAL OF APPLIED PHYSICS, 1992, 72 (09) : 4452 - 4454
  • [2] THE CHARACTERIZATION OF SI/SI1-XGEX SUPERLATTICES BY X-RAY TECHNIQUES
    LYONS, MH
    HALLIWELL, MAG
    TUPPEN, CG
    GIBBINGS, CJ
    INSTITUTE OF PHYSICS CONFERENCE SERIES, 1987, (87): : 609 - 614
  • [3] X-RAY-DIFFRACTION ANALYSIS OF SI1-XGEX/SI SUPERLATTICES
    MAI, ZH
    OUYANG, JT
    CUI, SF
    LI, JH
    WANG, CY
    LI, CR
    JOURNAL OF APPLIED PHYSICS, 1992, 72 (08) : 3474 - 3479
  • [4] Spectroscopic ellipsometry and X-ray diffraction studies on Si1-xGex/Si epifilms and superlattices
    Xie, Deng
    Qiu, Zhi Ren
    Wan, Lingyu
    Talwar, Devki N.
    Cheng, Hung-Hsiang
    Liu, Shiyuan
    Mei, Ting
    Feng, Zhe Chuan
    APPLIED SURFACE SCIENCE, 2017, 421 : 748 - 754
  • [5] AN X-RAY-DIFFRACTION STUDY OF RELAXATION IN SI/SI1-XGEX STRAINED LAYER SUPERLATTICES
    TUPPEN, CG
    GIBBINGS, CJ
    LYONS, MH
    HALLIWELL, MAG
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1987, 134 (8B) : C543 - C543
  • [6] X-ray studies of Si1-xGex single crystals
    Argunova, TS
    Gutkin, MY
    Zabrodskii, AG
    Sorokin, LM
    Tregubova, AS
    Shcheglov, MP
    Abrosimov, NV
    Je, JH
    Yi, JM
    PHYSICS OF THE SOLID STATE, 2005, 47 (07) : 1225 - 1232
  • [7] The resonant tunneling in Si1-xGex/Si superlattices
    Xu, Li-Ping
    Wen, Ting-Dun
    Yang, Xiao-Feng
    Zhang, Wen-Dong
    NANOSCIENCE AND TECHNOLOGY, PTS 1 AND 2, 2007, 121-123 : 645 - 648
  • [8] Characterization of a Quantum Well in an Si/Si1-xGex/Si Heterostructure by X-ray Diffractometry
    Afanas'ev A.M.
    Boltaev A.P.
    Imamov R.M.
    Mukhamedzhanov E.Kh.
    Rzaev M.M.
    Chuev M.A.
    Russian Microelectronics, 2001, 31 (1) : 1 - 6
  • [9] STRAIN ADJUSTMENT IN SI1-XGEX/SI SUPERLATTICES
    HERZOG, HJ
    JORKE, H
    KASPER, E
    MANTL, S
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1987, 134 (8B) : C543 - C543
  • [10] X-ray scattering investigation of the interfaces in Si/Si1-xGex superlattices on Si(001) grown by MBE and UHV-CVD
    Baribeau, J.-M.
    Lafontaine, H.
    Thin Solid Films, 1998, 321 : 141 - 147
12345