Electronic and bonding structures of B-C-N thin films investigated by x-ray absorption and photoemission spectroscopy

被引:0
|
作者
Ray, S.C. [1 ]
Tsai, H.M. [1 ]
Bao, C.W. [1 ]
Chiou, J.W. [1 ]
Jan, J.C. [1 ]
Kumar, K. P. Krishna [1 ]
Pong, W.F. [1 ]
Tsai, M.-H. [2 ]
Chattopadhyay, S. [3 ]
Chen, L.C. [3 ]
Chien, S.C. [4 ]
Lee, M.T. [4 ]
Lin, S.T. [4 ]
Chen, K.H. [5 ]
机构
[1] Department of Physics, Tamkang University, Tamsui, 251, Taiwan
[2] Department of Physics, National Sun Yat-Sen University, Kaohsiung, 804, Taiwan
[3] Centre for Condensed Mater Sciences, National Taiwan University, Taipei, 106, Taiwan
[4] Department of Mechanical Engineering, Natl. Taiwan Univ. of Sci./Technol., Taipei, 106, Taiwan
[5] Inst. of Atom. and Molecular Science, Academica Sinica, Taipei, 106, Taiwan
来源
Journal of Applied Physics | 2004年 / 96卷 / 01期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
14
引用
收藏
页码:208 / 211
相关论文
共 50 条
  • [1] Electronic and bonding structures of B-C-N thin films investigated by x-ray absorption and photoemission spectroscopy
    Ray, SC
    Tsai, HM
    Bao, CW
    Chiou, JW
    Jan, JC
    Kumar, KPK
    Pong, WF
    Tsai, MH
    Chattopadhyay, S
    Chen, LC
    Chien, SC
    Lee, MT
    Lin, ST
    Chen, KH
    JOURNAL OF APPLIED PHYSICS, 2004, 96 (01) : 208 - 211
  • [2] Electronic and bonding structures of amorphous Si-C-N thin films by x-ray absorption spectroscopy
    Tsai, HM
    Jan, JC
    Chiou, JW
    Pong, WF
    Tsai, MH
    Chang, YK
    Chen, YY
    Yang, YW
    Lai, LJ
    Wu, JJ
    Wu, CT
    Chen, KH
    Chen, LC
    APPLIED PHYSICS LETTERS, 2001, 79 (15) : 2393 - 2395
  • [3] Bonding characteristics of DC magnetron sputtered B-C-N thin films investigated by Fourier-transformed infrared spectroscopy and X-ray photoelectron spectroscopy
    Linss, V
    Rodil, SE
    Reinke, P
    Garnier, MG
    Oelhafen, P
    Kreissig, U
    Richter, F
    THIN SOLID FILMS, 2004, 467 (1-2) : 76 - 87
  • [4] Bonding Structures of ZrHx Thin Films by X-ray Spectroscopy
    Magnuson, Martin
    Eriksson, Fredrik
    Hultman, Lars
    Hogberg, Hans
    JOURNAL OF PHYSICAL CHEMISTRY C, 2017, 121 (46): : 25750 - 25758
  • [5] X-ray photoemission spectroscopy of thin films
    Hartmann, AJ
    Lamb, RN
    CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE, 1997, 2 (05): : 511 - 516
  • [6] X-ray photoemission spectroscopy of thin films
    Surface Science and Technology, The University of New South Wales, Sydney, NSW 2052, Australia
    Curr. Opin. Solid State Mater. Sci., 5 (511-516):
  • [7] Electronic properties and bonding in ZrHx thin films investigated by valence-band x-ray photoelectron spectroscopy
    Magnuson, Martin
    Schmidt, Susann
    Hultman, Lars
    Hogberg, Hans
    PHYSICAL REVIEW B, 2017, 96 (19)
  • [8] Electronic Structure of BiFe1-xMnxO3 Thin Films Investigated by X-Ray Absorption Spectroscopy
    Ablat, Abduleziz
    Muhemmed, Emin
    Si, Cheng
    Wang, Jiaou
    Qian, Haijie
    Wu, Rui
    Zhang, Nian
    Wu, Rong
    Ibrahim, Kurash
    JOURNAL OF NANOMATERIALS, 2012, 2012
  • [9] Orientation of B-C-N hybrid films deposited on Ni (111) and polycrystalline Ti substrates explored by X-ray absorption spectroscopy
    Mannan, Md. Abdul
    Baba, Yuji
    Kida, Tetsuya
    Nagano, Masamitsu
    Shimoyama, Iwao
    Hirao, Norie
    Noguchi, Hideyuki
    THIN SOLID FILMS, 2011, 519 (06) : 1780 - 1786
  • [10] Electronic structures of Fe3-xMxO4 (M=Mn,Zn) spinel oxide thin films investigated by X-ray photoemission spectroscopy and X-ray magnetic circular dichroism
    Takaobushi, Junichi
    Ishikawa, Mizue
    Ueda, Shigenori
    Ikenaga, Eiji
    Kim, Jung-Jin
    Kobata, Masaaki
    Takeda, Yukiharu
    Saitoh, Yuji
    Yabashi, Makina
    Nishino, Yoshinori
    Miwa, Daigo
    Tamasaku, Kenji
    Ishikawa, Tetsuya
    Satoh, Issei
    Tanaka, Hidekazu
    Kobayashi, Keisuke
    Kawai, Tomoji
    PHYSICAL REVIEW B, 2007, 76 (20):