Persistent spectral hole burning of Sm2+ and Eu3+ ions in sol-gel derived glasses

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Dept. of Mat. Sci. and Engineering, Nagoya Institute of Technology, Showa, Nagoya 466-8555, Japan ^{[1
]}

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J Non Cryst Solids | / 170-175期

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Number:; -; Acronym:; MEXT; Sponsor: Ministry of Education; Culture; Sports; Science and Technology;

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[1] Persistent spectral hole burning of Sm2+ and Eu3+ ions in sol-gel derived glasses
Nogami, M
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1999, 259 : 170 - 175
[2] Room temperature persistent spectral hole burning of Eu3+ ions doped in sol-gel derived glasses
Nogami, M
JOURNAL OF LUMINESCENCE, 2002, 98 (1-4) : 289 - 294
[3] Room temperature persistent spectral hole-burning in sol-gel-derived glasses doped with Eu3+ ions
Nogami, M
Hayakawa, T
JOURNAL OF SOL-GEL SCIENCE AND TECHNOLOGY, 2003, 26 (1-3) : 1001 - 1004
[4] Room Temperature Persistent Spectral Hole-Burning in Sol-Gel-Derived Glasses Doped with Eu3+ Ions
Masayuki Nogami
Tomokatsu Hayakawa
Journal of Sol-Gel Science and Technology, 2003, 26 : 1001 - 1004
[5] Persistent spectral hole burning of Eu3+ ions in silicate glasses
Fujita, K
Hirao, K
Tanaka, K
Soga, N
Sasaki, H
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1998, 37 (4B): : 2267 - 2270
[6] Persistent spectral hole burning of Eu3+ ions in silicate glasses
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Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers, 1998, 37 (4 B): : 2267 - 2270
[7] Persistent spectral hole burning of Eu3+ ions in TiO2-SiO2 glass prepared by sol-gel method
You, HP
Nogami, M
JOURNAL OF ALLOYS AND COMPOUNDS, 2006, 408 : 796 - 799
[8] Persistent spectral hole burning of Eu3+ ions in TiO 2-SiO2 glass prepared by sol-gel method
You, Hongpeng
Nogami, Masayuki
Journal of Alloys and Compounds, 1600, 408-412 : 796 - 799
[9] Sm2+-doped silicate glasses: Sol-gel processing and persistent spectral hole burning
Nogami, M
Abe, Y
SOL-GEL OPTICS IV, 1997, 3136 : 239 - 245
[10] Persistent spectral hole burning of Eu3+ ions in sodium aluminosilicate glasses
Fujita, K
Hirao, K
Tanaka, K
Soga, N
Sasaki, H
JOURNAL OF APPLIED PHYSICS, 1997, 82 (10) : 5114 - 5120

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