Fermi surface evolution in cuprates: an angle-resolved photoemission study

被引:0
|
作者
Departments of Physics, Applied Physics and Stanford Synchrotron Radiation Laboratory, Stanford University, Stanford, CA, United States [1 ]
机构
来源
基金
美国国家科学基金会;
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [1] Fermi surface evolution in cuprates: an angle-resolved photoemission study
    Ronning, F
    Kim, C
    Shen, ZX
    PHYSICA C, 1999, 317 : 320 - 324
  • [2] Fermi surface studies using angle-resolved photoemission
    Kevan, SD
    JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1995, 75 : 175 - 186
  • [3] Measuring the gap in angle-resolved photoemission experiments on cuprates
    Kordyuk, AA
    Borisenko, SV
    Knupfer, M
    Fink, J
    PHYSICAL REVIEW B, 2003, 67 (06):
  • [4] Angle-resolved photoemission from cuprates with static stripes
    Valla, Tonica
    PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS, 2012, 481 : 66 - 74
  • [5] Angle-resolved photoemission study of the doping evolution of a three-dimensional Fermi surface in NaxCoO2
    Arakane, T.
    Sato, T.
    Takahashi, T.
    Fujii, T.
    Asamitsu, A.
    New Journal of Physics, 2011, 13
  • [6] Angle-resolved photoemission study of the doping evolution of a three-dimensional Fermi surface in NaxCoO2
    Arakane, T.
    Sato, T.
    Takahashi, T.
    Fujii, T.
    Asamitsu, A.
    NEW JOURNAL OF PHYSICS, 2011, 13
  • [7] Angle-resolved photoemission spectroscopy study on the Fermi surface topology of NaxCoO2
    Yang, H-B
    Wang, Z.
    Ding, H.
    JOURNAL OF PHYSICS-CONDENSED MATTER, 2007, 19 (35)
  • [9] Angle-resolved photoemission spectroscopy of a Fermi–Hubbard system
    Peter T. Brown
    Elmer Guardado-Sanchez
    Benjamin M. Spar
    Edwin W. Huang
    Thomas P. Devereaux
    Waseem S. Bakr
    Nature Physics, 2020, 16 : 26 - 31
  • [10] How to determine Fermi vectors by angle-resolved photoemission
    Kipp, L
    Rossnagel, K
    Solterbeck, C
    Strasser, T
    Schattke, W
    Skibowski, M
    PHYSICAL REVIEW LETTERS, 1999, 83 (26) : 5551 - 5554