Strain of a biomembrane caused by a local tangential force: Application to magnetic tweezer measurements

被引：0
|
作者：
Dept. für Biophysik E22, TU München, James Frank St., D-85747 Garching bei München, Germany [1 ]
不详 [2 ]
机构：
来源：
Phys Rev E. | / 2-3卷 / 3402-3407期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 14 条
  • [1] Strain of a biomembrane caused by a local tangential force: Application to magnetic tweezer measurements
    Boulbitch, AA
    PHYSICAL REVIEW E, 1999, 59 (03) : 3402 - 3407
  • [2] Local field loop measurements by magnetic force microscopy
    Coisson, Marco
    Barrera, Gabriele
    Celegato, Federica
    Enrico, Emanuele
    Manzin, Alessandra
    Olivetti, Elena S.
    Tiberto, Paola
    Vinai, Franco
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2014, 47 (32)
  • [3] Magnetic vortex chirality determination via local hysteresis loops measurements with magnetic force microscopy
    Coisson, Marco
    Barrera, Gabriele
    Celegato, Federica
    Manzin, Alessandra
    Vinai, Franco
    Tiberto, Paola
    SCIENTIFIC REPORTS, 2016, 6
  • [4] Magnetic vortex chirality determination via local hysteresis loops measurements with magnetic force microscopy
    Marco Coïsson
    Gabriele Barrera
    Federica Celegato
    Alessandra Manzin
    Franco Vinai
    Paola Tiberto
    Scientific Reports, 6
  • [5] Local hysteresis loops measurements on irradiated FeSiB patterned dots by magnetic force microscopy
    Coisson, M.
    Barrera, G.
    Celegato, F.
    Enrico, E.
    Olivetti, E. S.
    Tiberto, P.
    Vinai, F.
    JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 2015, 373 : 250 - 254
  • [6] An Application of Magnetic Measurements for Study of Local Transport Characteristics of Modern Superconducting Materials
    Rudnev, Igor A.
    Pokrovskiy, Sergey V.
    Podlivaev, Aleksey I.
    IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 2012, 22 (03)
  • [7] APPLICATION OF FRACTAL ANALYSIS METHODS FOR LIFT HEIGHT OPTIMIZATION IN MAGNETIC FORCE MICROSCOPY MEASUREMENTS
    Bramowicz, M.
    Kulesza, S.
    Chrostek, T.
    Senderowski, C.
    ARCHIVES OF METALLURGY AND MATERIALS, 2018, 63 (03) : 1109 - 1113
  • [8] RESISTANCE CHANGE OF THIN PERMALLOY-FILMS CAUSED BY APPLIED STRESS AND ITS APPLICATION TO STRAIN-MEASUREMENTS
    SHINZATO, S
    KUWAHARA, K
    JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 1983, 35 (1-3) : 77 - 79
  • [9] Local anodic oxidation by atomic force microscopy for nano-Raman strain measurements on silicon-germanium thin films
    Kolanek, Krzysztof
    Hermann, Peter
    Dudek, Piotr T.
    Gotszalk, Teodor
    Chumakov, Dmytro
    Weisheit, Martin
    Hecker, Michael
    Zschech, Ehrenfried
    THIN SOLID FILMS, 2010, 518 (12) : 3267 - 3272
  • [10] ATOMIC-SCALE FRICTION MEASUREMENTS USING FRICTION FORCE MICROSCOPY .2. APPLICATION TO MAGNETIC MEDIA
    BHUSHAN, B
    RUAN, JA
    JOURNAL OF TRIBOLOGY-TRANSACTIONS OF THE ASME, 1994, 116 (02): : 389 - 396
12