Magnetic Shielding of an Electron Microscope.

被引：0

作者：

Pejas, W.

机构：

来源：

Optik (Jena) | 1978年 / 50卷 / 01期

关键词：

D O I：

暂无

中图分类号：

学科分类号：

摘要：

An unround electron-optical corrector is very susceptible to disturbances by magnetic fields. Methods to shield the corrector from magnetic fields are discussed. A resolution limit less than 1 A seems to be possible.

引用

页码：61 / 72

共 50 条

[1] The electron microscope.
Hartmann, M
Laue, MV
Rosenheim, A
Volmer, M
NATURWISSENSCHAFTEN, 1932, 20 : 49 - 49
[2] The electron microscope.
Waterman, AT
AMERICAN JOURNAL OF SCIENCE, 1941, 239 (05) : 386 - 388
[3] INVESTIGATION OF MAGNETIC STRUCTURES WITH THE SCANNING ELECTRON MICROSCOPE.
Balk, L.J.
Elsbrock, J.B.
1600, (0v):
[4] On the theory of the electron microscope.
Posener, Lotte
ZEITSCHRIFT FUR PHYSIK, 1933, 80 (11-12): : 813 - 818
[5] Theory of the electron microscope.
Glaser, Walter
ZEITSCHRIFT FUR PHYSIK, 1933, 83 (1-2): : 104 - 122
[6] MOIRE METHOD FOR STUDY OF MAGNETIC FIELDS IN TRANSMISSION ELECTRON MICROSCOPE.
Ivannikov, V.P.
Instruments and experimental techniques New York, 1986, 29 (3 pt 2): : 745 - 749
[7] VIBRATION DAMPER FOR ELECTRON MICROSCOPE.
Gasilin, V.V.
Kunchenko, V.V.
Miroshnichenko, Yu.T.
Instruments and experimental techniques New York, 1986, 29 (3 pt 2): : 761 - 762
[8] Cinematographic Observations in the Electron Microscope.
Guttmann, V.
Wessel, A.
Metall, 1974, 28 (05): : 456 - 458
[9] MULTISTAGE GUN IN AN ELECTRON MICROSCOPE.
Stoyanov, P.A.
Renskii, I.S.
Moseev, V.V.
Chalbasheva, L.A.
Vedeneev, A.E.
Instruments and experimental techniques New York, 1980, 23 (1 pt 2): : 229 - 233
[10] Localization of an electron through a microscope.
v Weizsaecker, K. F.
ZEITSCHRIFT FUR PHYSIK, 1931, 70 (1-2): : 114 - 130

← 1 2 3 4 5 →