New microscope for materials sciences

被引：0
|
作者：
Patzelt, Walter J. [1 ]
机构：
[1] Leica Mikroskopie und Systeme GmbH, Wetzlar, Germany
来源：
Praktische Metallographie/Practical Metallography | 1997年 / 34卷 / 11期
关键词：
Inspection - Lighting - Materials science - Microscopic examination - Polarization;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
The new LEICA DM LM materials microscope has been developed with the objective of fulfilling the requirements for ergonomic design and perfect handling together with operating convenience. This enables saving time and work is free of fatigue. The microscope is available ex works with 18 different basic stands which vary in the number of illumination axes, number of focusing levels and type of objective nosepiece.
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页码：583 / 587
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