CARD RESISTANCE TEST SYSTEM.

被引：0

作者：

Angelovich, E.P.

Kenny, R.A.

Shils, A.J.

Tompkins, A.R.

机构：

来源：

| 1600年 / 27期

关键词：

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

共 50 条

[1] CUSTOM CHIP/CARD DESIGN SYSTEM.
Barone, A.M.
Morrell, J.K.
IBM Journal of Research and Development, 1984, 28 (05): : 590 - 595
[2] AEROFEED-U CARD CHUTE FEED SYSTEM.
Staehl, U.
Waebar, R.
Textile Month, 1986, : 34 - 36
[3] DEVELOPMENT OF VLSI TEST SYSTEM.
Sudo, Tsuneta
Ichimiya, Yoshichika
Man-ei, Noboru
Research and Development in Japan Awarded the Okochi Memorial Prize, 1982, : 35 - 40
[4] NEW FLIGHT TEST SYSTEM.
Anon
Test (Oakland, California), 1987, 49 (05):
[5] 100 MHz VLSI TEST SYSTEM.
Maruyama, Hiromi
Denshi Tokyo/Electron Tokyo, 1980, (19): : 91 - 94
[6] AUTOMOTIVE DRIVE TRANSMISSION TEST SYSTEM.
Jobbeto, Koji
Seto, Shigeo
Yamamoto, Kazuo
National technical report, 1981, 27 (01): : 143 - 154
[7] FIELD TEST OF AN ATRIUM EXHAUST SYSTEM.
Building Standards, 1988, 57 (02): : 18 - 19
[8] COMPUTER CONTROLLED ENVIRONMENTAL TEST SYSTEM.
Anon
EP Electronic Production (London), 1985, 14 (03):
[9] PhotoFate: An indirect photolysis test system.
Tantuco, K
Mabury, SA
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1999, 218 : U72 - U72
[10] PATTERN GENERATOR FOR MEMORY TEST SYSTEM.
Megivern Jr., C.F.
IBM technical disclosure bulletin, 1983, 26 (3 A): : 1078 - 1079