IDENTIFYING CAUSES AND EFFECTS OF IONIC CONTAMINATION IN PWB ASSEMBLIES - PART 1.

被引：0

|

作者：

Dallessandro, Susan M. ^{[1
]}

Cabelka, Tim D. ^{[1
]}

机构：

[1] Dow Chemical USA, Midland, MI, USA, Dow Chemical USA, Midland, MI, USA

来源：

Electri-onics | 1985年 / 31卷 / 10期

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摘要：

This is part 1 of a two-part article that describes ionic contamination in PCB assemblies. This part describes an overview of its causes and effects.

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页码：43 / 45

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