X-RAY SPECTROSCOPIC INVESTIGATION OF THE ELECTRON STRUCTURE OF SILICON AND ALUMINUM OXIDES.

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作者：

Brytov, I.A.

Romashchenko, Yu.N.

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| 1978年 / 20卷 / 03期

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Compendex;

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摘要：

SILICON COMPOUNDS

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页码：384 / 389

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