Transmission electron microscopy of metallic multilayers

被引:0
|
作者
Walls, M.G. [1 ]
Chevalier, J.-P. [1 ]
Hytch, M.J. [1 ]
机构
[1] CNRS, Vitry sur Seine, France
来源
| 1996年 / Editions de Physique, Les Ulis, France卷 / 06期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [1] Transmission electron microscopy of metallic multilayers
    Walls, MG
    Chevalier, JP
    Hytch, MJ
    JOURNAL DE PHYSIQUE IV, 1996, 6 (C7): : 213 - 223
  • [2] Transmission electron microscopy study of metallic multilayers
    Han, K
    Yu-Zhang, K
    SCRIPTA MATERIALIA, 2004, 50 (06) : 781 - 786
  • [3] STRUCTURAL STUDIES OF METALLIC MULTILAYERS USING TRANSMISSION ELECTRON-MICROSCOPY
    CHEVALIER, JP
    METALLIC MULTILAYERS, 1989, 59 : 141 - 159
  • [4] CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY STUDIES OF METALLIC MULTILAYERS
    DEVEIRMAN, AEM
    HAKKENS, FJG
    DIRKS, AG
    ULTRAMICROSCOPY, 1993, 51 (1-4) : 306 - 315
  • [5] MULTILAYERS OBSERVED BY TRANSMISSION ELECTRON-MICROSCOPY
    LEPETRE, Y
    CHARAI, A
    THIN SOLID FILMS, 1983, 105 (01) : 71 - 74
  • [6] Imaging of multilayers with Fresnel contrast by transmission electron microscopy
    Galtier, P
    Valet, T
    MAGNETIC ULTRATHIN FILMS, MULTILAYERS AND SURFACES - 1997, 1997, 475 : 131 - 136
  • [7] TRANSMISSION ELECTRON-MICROSCOPY OBSERVATIONS OF MAGNETIC MULTILAYERS
    MODAK, AR
    PARKIN, SSP
    SMITH, DJ
    ULTRAMICROSCOPY, 1992, 47 (04) : 375 - 382
  • [8] Energy-filtered transmission electron microscopy of multilayers in semiconductors
    Liu, CP
    Boothroyd, CB
    Humphreys, CJ
    ELECTRON MICROSCOPY OF SEMICONDUCTING MATERIALS AND ULSI DEVICES, 1998, 523 : 159 - 164
  • [9] Transmission electron microscopy analysis of the interfaces of TiAlN/Mo multilayers
    Tavares, C. J.
    Rebouta, L.
    Riviere, J. P.
    Denanot, M. F.
    MICROSCOPY AND MICROANALYSIS, 2008, 14 : 1 - 4
  • [10] Characterization of Fe/Cr multilayers by analytical transmission electron microscopy
    R. Rennekamp
    Jürgen Thomas
    Birgit Arnold
    Kazutomo Suenaga
    Fresenius' Journal of Analytical Chemistry, 1998, 361 : 621 - 625