Interfacial observations of Ni/Ni3Si and Ni/Ni3Ga diffusion couples

被引：0
|
作者：
机构：
来源：
Philos Mag A | / 3卷 / 149期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [1] Interfacial observations of Ni/Ni3Si and Ni/Ni3Ga diffusion couples
    Horita, Z
    Fujiwara, K
    Ootoshi, Y
    Komai, N
    Watanabe, M
    Nemoto, M
    PHILOSOPHICAL MAGAZINE LETTERS, 1997, 75 (03) : 149 - 153
  • [2] ALLOYING BEHAVIOR OF NI3AL, NI3GA, NI3SI AND NI3GE
    OCHIAI, S
    OYA, Y
    SUZUKI, T
    ACTA METALLURGICA, 1984, 32 (02): : 289 - 298
  • [3] Ni and Ga diffusion in polycrystalline Ni3Ga
    Cermák, J
    Rothová, V
    INTERMETALLICS, 2002, 10 (08) : 765 - 769
  • [4] Diffusion in Ni3Al, Ni3Ga and Ni3Ge
    Numakura, H
    Ikeda, T
    Nakajima, H
    Koiwa, M
    MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2001, 312 (1-2): : 109 - 117
  • [5] Lamellar Ni3Si Microchannels and Ni3Si Micropore Arrays in Ni-Ni3Si Hypereutectic Alloys
    Wei, Lufeng
    Zhao, Zhilong
    Gao, Jianjun
    Cui, Kai
    Chen, Sen
    Guo, Jingying
    Liu, Lin
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2018, 165 (02) : E45 - E49
  • [6] Analysis of diffusion mechanisms in Ni3Al, Ni3Ge and Ni3Ga
    Belova, IV
    Murch, GE
    DEFECTS AND DIFFUSION IN CERAMICS: AN ANNUAL RETROSPECTIVE II, 2000, 177-1 : 59 - 68
  • [7] Analysis of diffusion mechanisms in Ni3Al, Ni3Ge and Ni3Ga
    Belova, I.V.
    Murch, G.E.
    Diffusion and Defect Data. Pt A Defect and Diffusion Forum, 2000, 177 : 59 - 68
  • [8] Point defects and diffusion in Ni3Ga
    Ikeda, T
    Almazouzi, A
    Funao, A
    Numakura, H
    Koiwa, M
    Shirai, Y
    Nonaka, K
    Sprengel, W
    Nakajima, H
    DIFFUSION MECHANISMS IN CRYSTALLINE MATERIALS, 1998, 527 : 179 - 184
  • [9] Periodic layered structure in Ni3Si/Zn diffusion couples
    He, Meng
    Su, Xuping
    Yin, Fucheng
    Wang, Jianhua
    Li, Zhi
    SCRIPTA MATERIALIA, 2008, 59 (04) : 411 - 413
  • [10] Ni3Al, Ni3Ga, Ni3In, and NiGa by XPS
    Hsu, L.-S.
    Surface Science Spectra, 2000, 7 (02): : 122 - 133
12345