In situ study by synchrotron X-ray diffraction of the motion of basal stacking faults during the reverse-phase transformation of a Cu-Zn-Al single crystal

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作者：
Jourdan, C. [1 ]
Gastaldi, J. [1 ]
Baronnet, A. [1 ]
Belkahla, S. [1 ]
Guenin, G. [1 ]
机构：
[1] Campus de Luminy, Marseille, France
来源：
Materials Science and Engineering A | 1999年 / 266卷 / 01期
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页码：191 / 197
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