Electron-stimulated desorption, secondary emission and charging of ionic crystals

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机构：
[1] Atabaev, B.G.
[2] Besedina, E.A.
[3] Kareev, M.S.
[4] Dzabbarganov, R.
来源：
Atabaev, B.G. | 1600年 / 16期
关键词：
Desorption - Electron Beams - Mass Spectrometry - Spectroscopy; Auger Electron;
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摘要：
Negative and positive charging of ionic monocrystals (KCl, NaCl, Al2O3, MgO, SiO2 and LiH) under low-energy electron irradiation is investigated by AES and mass spectrometry. Secondary emission and electron-stimulated desorption negative ions of LiH data are presented. The mass spectra of sputtered neutrals post-ionized into negative ions, and their ionization coefficients on the auxiliary target with a low work function, are presented. A phenomenological model of charging of dielectrics that depends on defect formation and secondary emission properties under low-energy electron irradiation is presented.
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