ICCQ: A test method for analogue VLSI using local current sensors

被引：0
|
作者：
Van Lammeren, Joop P. M. [1 ,2 ]
机构：
[1] Philips Semiconductors, Gerstweg 2, 6534 AE Nijmegen, Netherlands
[2] Philips Semiconductors, Nijmegen, Netherlands
来源：
Journal of Electronic Testing: Theory and Applications (JETTA) | 1999年 / 14卷 / 01期
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摘要：
7
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页码：33 / 38
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