Metastability modeling of compliant substrate critical thickness using experimental strain relief data

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Appl Phys Lett | / 10卷 / 1344期

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[1] Metastability modeling of compliant substrate critical thickness using experimental strain relief data
CarterComan, C
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[2] Effect of strain transfer on critical thickness for epitaxial layers grown on compliant substrate
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[5] Critical thickness condition for a strained compliant substrate/epitaxial film system
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[6] The critical thickness of an epilayer deposited on a semiconductor-on-insulator compliant substrate
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