共 50 条
- [1] OBSERVATION OF GAAS(110) SURFACE BY AN ULTRAHIGH-VACUUM ATOMIC-FORCE MICROSCOPE JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1994, 33 (6B): : 3739 - 3742
- [2] ATOMICALLY RESOLVED IMAGE OF CLEAVED GAAS(110) SURFACE OBSERVED WITH AN ULTRAHIGH-VACUUM ATOMIC-FORCE MICROSCOPE JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1994, 33 (1A): : L52 - L54
- [3] OBSERVATION OF ATOMIC DEFECTS ON LIF(100) SURFACE WITH ULTRAHIGH-VACUUM ATOMIC-FORCE MICROSCOPE (UHV AFM) JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1993, 32 (6B): : 2980 - 2982
- [4] ATOMICALLY RESOLVED INP(110) SURFACE OBSERVED WITH NONCONTACT ULTRAHIGH-VACUUM ATOMIC-FORCE MICROSCOPE JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1995, 34 (8B): : L1086 - L1088
- [5] Atomically resolved image of cleaved GaAs(110) surface observed with an ultrahigh vacuum atomic force microscope Japanese Journal of Applied Physics, Part 2: Letters, 1994, 33 (1 A):
- [8] ATOMIC-RESOLUTION IMAGING OF ZNSSE(110) SURFACE WITH ULTRAHIGH-VACUUM ATOMIC-FORCE MICROSCOPE (UHV-AFM) JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1995, 34 (4A): : L462 - L464
- [9] BIDIRECTIONAL FORCE MICROSCOPE FOR SURFACE-ANALYSIS IN ULTRAHIGH-VACUUM HELVETICA PHYSICA ACTA, 1992, 65 (06): : 868 - 869
- [10] ULTRAHIGH-VACUUM ATOMIC-FORCE MICROSCOPE WITH SAMPLE CLEAVING MECHANISM JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994, 12 (03): : 1705 - 1707