ASYNCHRONOUS INTERFACE TESTER.

被引：0
|
作者：
Bogholtz, R.
Bosch, L.
Kazmierczak, G.
Mezzacappa Jr., V.
Perini, G.
机构：
来源：
IBM technical disclosure bulletin | 1984年 / 27卷 / 4 B期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：2450 / 2451
相关论文
共 50 条
  • [1] HEAD TESTER.
    Anon
    IBM technical disclosure bulletin, 1986, 28 (11): : 4692 - 4696
  • [2] SEMIAUTOMATIC BABBITTING TESTER.
    Bruk, M.V.
    Zel'tser, V.S.
    Kuz'mitskii, M.L.
    1978, 14 (07): : 663 - 665
  • [3] DRILL BIT TESTER.
    Chen, P.C.
    Schoening, R.D.
    IBM technical disclosure bulletin, 1983, 26 (7 A):
  • [4] SUBSTRATE METALLURGY TESTER.
    Anon
    IBM technical disclosure bulletin, 1986, 29 (02):
  • [5] Temperature sensation tester.
    Beney, C
    LANCET, 1932, 1 : 732 - 732
  • [6] NETWORK QUALITY TESTER.
    Dietschi, Rolf
    Gessler, Christoph
    Staber, Edwin
    Electrical communication, 1983, 58 (02): : 162 - 168
  • [7] CAPACITOR LEAKAGE TESTER.
    Redford, K.M.
    New Electronics, 1982, 15 (06):
  • [8] REMOTE LINE TESTER.
    Brading, Edward
    Electrical communication, 1980, 55 (03): : 202 - 209
  • [9] AUTOMATIC TIGHTNESS TESTER.
    Makarov, V.A.
    Novikov, B.V.
    Novozhilov, L.A.
    Orlov, V.K.
    1978, 14 (07): : 586 - 590
  • [10] Automatic recording waterproof tester.
    Hodges, AL
    PHILOSOPHICAL MAGAZINE, 1930, 10 (63): : 327 - 328
12345