ANALYZING SINGLE CRYSTALS BY AUGER ELECTRON SPECTROSCOPY.

被引：0

作者：

Vasil'ev, L.A.

Zaporozhchenko, V.I.

Nosov, A.P.

Rakhovskii, V.I.

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| 1600年 / 27期

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摘要：

SPECTROSCOPY, AUGER ELECTRON

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[1] ANALYZING SINGLE-CRYSTALS BY AUGER-ELECTRON SPECTROSCOPY
VASILEV, LA
ZAPOROZHCHENKO, VI
NOSOV, AP
RAKHOVSKII, VI
MEASUREMENT TECHNIQUES USSR, 1984, 27 (05): : 471 - 472
[2] ANALYZING SEMICONDUCTORS WITH AUGER SPECTROSCOPY.
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1600, (03):
[3] FUNDAMENTALS OF AUGER ELECTRON SPECTROSCOPY.
Levenson, L.L.
Scanning Electron Microscopy, 1983, (pt 4) : 1643 - 1653
[4] QUANTITATIVE ANALYSIS BY AUGER ELECTRON SPECTROSCOPY.
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Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes, 1983, 22 (11): : 1631 - 1642
[5] TECHNOLOGICAL APPLICATION OF AUGER ELECTRON SPECTROSCOPY.
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Chavka, N.G.
Acta Mechanica, 1973, 1 (03): : 183 - 193
[6] Study of Insulating Materials by Auger Electron Spectroscopy.
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[7] MICROCOMPUTER-AIDED AUGER ELECTRON SPECTROSCOPY.
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[8] Investigation of Surfaces by Ion Scattering Spectroscopy and Auger Electron Spectroscopy.
Hauser, H.J.
Seiler, H.
Optik (Jena), 1987, 77 (02): : 75 - 79
[9] ENERGY ANALYZING ELECTRON MICROSCOPE FOR LOCAL ELECTRON SPECTROSCOPY.
Bakulin, E.A.
Balabanova, L.A.
Ostroumova, E.G.
Stepin, E.V.
Slutsker, A.I.
Shakh-Budagov, A.L.
Instruments and experimental techniques New York, 1983, 26 (3 pt 2): : 692 - 695
[10] BACKGROUND INTENSITY SIGNAL NORMALISATION IN AUGER ELECTRON SPECTROSCOPY.
Bishop, H.E.
1983, (0v)

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